Labore

Signal Integrity Characterization on PCB
GSG probe measurements are performed at the institute for frequencies up to 110 GHz on all kinds of planar circuitry: from absolutely smooth and planar wafer substrates up to flexible PCB's.
17. Februar 2019 Kategorie: Labore_Overview
Future concepts for autonomous driving
At LHFT a test vehicle is used for evaluating radar sensors and systems for autonomous driving.
17. Februar 2019 Kategorie: Labore_Overview
Antenna characterization up to 500 GHz
In order to precisely characterize antennas the LHFT operates an anechoic chamber incorporating a 4-axis positioning robot. Signal generation and analysis is possible up to 500 GHz.
17. Februar 2019 Kategorie: Labore_Overview
3D printed interconnects up to 67 GHz
The 3D-Microwave Assembly & Interconnects Laboratory realizes novel approaches for additive manufacturing of interconnects suitable for frequencies up to V-Band.
17. Februar 2019 Kategorie: Labore_Overview
Network Analysis up to THz-Range
The Institute offers a wide spectrum of techniques and infrastructure for network analysis up to THz-frequency range.
9. Februar 2019 Kategorie: Labore_Overview

The institute is equipped with excellent laboratory facilities. Here you find a short overview of the available instruments and labs.

Micro- and Millimeterwave Measurement Instrumentation

8-port full duplex Vector Signal Transceiver (VST) up to 6 GHz with a Bandwidth of 80 MHz (based on NI PXIe‑5645R)
Phase noise measurement with AnaPico APPH20G for signals up to 26 GHz
Signal and spectral analyzer up to 8 GHz (R&S FSW-8)
2-Port VNA with complete frequency coverage up to 500 GHz (e.g. Rohde & Schwarz ZVA with ZVA-Z90/110/170/220/325/500)
Differential „True Mode“ 2-Port network analysis / Single-Ended 4-port analysis up to 67 GHz (e.g. Agilent PNA-X 67 GHz)
Spectral analysis up to 850 GHz
Noise measurements (incl. 1/f-Noise)
Materialcharacterisation up to 325 GHz
Antenna measurments
Modular Mixed-Signal-Testsystem
Analysis capability of signalintegrity issues and signalpath characterization in time and frequency domain
Time domain measurements reaching to the pico second range
PCB measurements for signalintegrity and material characterisation

Optical spectral analyzer 600 nm … 1700 nm (e.g. Yokogawa AQ6370)
Broadband tunable laser sources (e.g. Agilent 81600)
Super-continuum white light source (Koheras SuperK Compact)
Erbium-doped fiber amplifiers, ytterbium fiber laser, femtosecond fiber laser
Fusion splicers for standard and specialty fibers (Ericson FSU995, Fitel S176 + S183)
Polarisation measurement instrumentation, Stokes polarimeter
Optical power detectors from UV to FIR, from 100 fW up to 200 W
IR beam diagnostics, beam quality measurement